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Convergence, Admissibility, and Fit of Alternative Confirmatory Factor Analysis Models for MTMM Data
Lance, Charles E.; Fan, Yi – Educational and Psychological Measurement, 2016
We compared six different analytic models for multitrait-multimethod (MTMM) data in terms of convergence, admissibility, and model fit to 258 samples of previously reported data. Two well-known models, the correlated trait-correlated method (CTCM) and the correlated trait-correlated uniqueness (CTCU) models, were fit for reference purposes in…
Descriptors: Multitrait Multimethod Techniques, Factor Analysis, Models, Goodness of Fit
von Davier, Matthias – ETS Research Report Series, 2016
This report presents results on a parallel implementation of the expectation-maximization (EM) algorithm for multidimensional latent variable models. The developments presented here are based on code that parallelizes both the E step and the M step of the parallel-E parallel-M algorithm. Examples presented in this report include item response…
Descriptors: Psychometrics, Mathematics, Models, Statistical Analysis
Konold, Timothy – Journal of Psychoeducational Assessment, 2018
School-level contextual factors have been found to influence reports of school climate. The purpose of the current study was to evaluate the extent to which these associations are related to the school climate traits being measured or the methods (i.e., informants) used to obtain them. Data from a multilevel multitrait-multimethod (MTMM) design in…
Descriptors: Hierarchical Linear Modeling, Multitrait Multimethod Techniques, Computation, Context Effect
Konold, Timothy R.; Shukla, Kathan – Educational Assessment, 2017
The use of multiple informants is common in assessments that rely on the judgments of others. However, ratings obtained from different informants often vary as a function of their perspectives and roles in relation to the target of measurement, and causes unrelated to the trait being measured. We illustrate the usefulness of a latent variable…
Descriptors: Educational Environment, Multitrait Multimethod Techniques, Computation, Validity