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Aloisi, Cesare – European Journal of Education, 2023
This article considers the challenges of using artificial intelligence (AI) and machine learning (ML) to assist high-stakes standardised assessment. It focuses on the detrimental effect that even state-of-the-art AI and ML systems could have on the validity of national exams of secondary education, and how lower validity would negatively affect…
Descriptors: Standardized Tests, Test Validity, Credibility, Algorithms
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Sami Baral; Eamon Worden; Wen-Chiang Lim; Zhuang Luo; Christopher Santorelli; Ashish Gurung; Neil Heffernan – Grantee Submission, 2024
The effectiveness of feedback in enhancing learning outcomes is well documented within Educational Data Mining (EDM). Various prior research have explored methodologies to enhance the effectiveness of feedback to students in various ways. Recent developments in Large Language Models (LLMs) have extended their utility in enhancing automated…
Descriptors: Automation, Scoring, Computer Assisted Testing, Natural Language Processing
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Myers, Matthew C.; Wilson, Joshua – International Journal of Artificial Intelligence in Education, 2023
This study evaluated the construct validity of six scoring traits of an automated writing evaluation (AWE) system called "MI Write." Persuasive essays (N = 100) written by students in grades 7 and 8 were randomized at the sentence-level using a script written with Python's NLTK module. Each persuasive essay was randomized 30 times (n =…
Descriptors: Construct Validity, Automation, Writing Evaluation, Algorithms
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Feng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating