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Kalkan, Ömür Kaya; Kelecioglu, Hülya – Educational Sciences: Theory and Practice, 2016
Linear factor analysis models used to examine constructs underlying the responses are not very suitable for dichotomous or polytomous response formats. The associated problems cannot be eliminated by polychoric or tetrachoric correlations in place of the Pearson correlation. Therefore, we considered parameters obtained from the NOHARM and FACTOR…
Descriptors: Sample Size, Nonparametric Statistics, Factor Analysis, Correlation
Yildirim, Serkan; Kaban, Abdullatif; Yildirim, Gürkan; Çelik, Embiya – Turkish Online Journal of Educational Technology - TOJET, 2016
Digital badges are the components demonstrating competency and knowledge of the learners. The use of digital badges used to reflect the skills of learners is becoming increasingly widespread in the teaching environments. In addition, these badges are starting to take their places among documents such as certificates and diplomas. In this study,…
Descriptors: Foreign Countries, Recognition (Achievement), Evaluation Methods, Information Storage
Kaplan, David; Turner, Alyn – OECD Publishing (NJ1), 2012
The OECD Program for International Student Assessment (PISA) and the OECD Teaching and Learning International Survey (TALIS) constitute two of the largest ongoing international student and teacher surveys presently underway. Data generated from these surveys offer researchers and policy-makers opportunities to identify particular educational…
Descriptors: Outcomes of Education, Teacher Surveys, Policy Analysis, Educational Change
Weiss, David J., Ed. – 1980
This report is the Proceedings of the third conference of its type. Included are 23 of the 25 papers presented at the conference, discussion of these papers by invited discussants, and symposium papers by a group of leaders in adaptive testing and latent trait test theory research and applications. The papers are organized into the following…
Descriptors: Academic Ability, Academic Achievement, Comparative Testing, Computer Assisted Testing