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Armstrong, R. D.; And Others – Applied Psychological Measurement, 1996
When the network-flow algorithm (NFA) and the average growth approximation algorithm (AGAA) were used for automated test assembly with American College Test and Armed Services Vocational Aptitude Battery item banks, results indicate that reasonable error in item parameters is not harmful for test assembly using NFA or AGAA. (SLD)
Descriptors: Algorithms, Aptitude Tests, College Entrance Examinations, Computer Assisted Testing
An Optimization Model for Test Assembly To Match Observed-Score Distributions. Research Report 94-7.
van der Linden, Wim J.; Luecht, Richard M. – 1994
An optimization model is presented that allows test assemblers to control the shape of the observed-score distribution on a test for a population with a known ability distribution. An obvious application is for item response theory-based test assembly in programs where observed scores are reported and operational test forms are required to produce…
Descriptors: Ability, Foreign Countries, Heuristics, Item Response Theory