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| Algorithms | 1 |
| Aptitude Tests | 1 |
| College Entrance Examinations | 1 |
| Computer Assisted Testing | 1 |
| Heuristics | 1 |
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| Test Items | 1 |
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| Applied Psychological… | 1 |
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| Armstrong, R. D. | 1 |
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Peer reviewedArmstrong, R. D.; And Others – Applied Psychological Measurement, 1996
When the network-flow algorithm (NFA) and the average growth approximation algorithm (AGAA) were used for automated test assembly with American College Test and Armed Services Vocational Aptitude Battery item banks, results indicate that reasonable error in item parameters is not harmful for test assembly using NFA or AGAA. (SLD)
Descriptors: Algorithms, Aptitude Tests, College Entrance Examinations, Computer Assisted Testing
