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Direct linkLiu, Yang; Maydeu-Olivares, Alberto – Educational and Psychological Measurement, 2013
Local dependence (LD) for binary IRT models can be diagnosed using Chen and Thissen's bivariate X[superscript 2] statistic and the score test statistics proposed by Glas and Suarez-Falcon, and Liu and Thissen. Alternatively, LD can be assessed using general purpose statistics such as bivariate residuals or Maydeu-Olivares and Joe's M[subscript r]…
Descriptors: Item Response Theory, Statistical Analysis, Models, Goodness of Fit
Finch, W. Holmes – Applied Psychological Measurement, 2012
Increasingly, researchers interested in identifying potentially biased test items are encouraged to use a confirmatory, rather than exploratory, approach. One such method for confirmatory testing is rooted in differential bundle functioning (DBF), where hypotheses regarding potential differential item functioning (DIF) for sets of items (bundles)…
Descriptors: Test Bias, Test Items, Statistical Analysis, Models
