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Download full textBosch, Nigel – Journal of Educational Data Mining, 2021
Automatic machine learning (AutoML) methods automate the time-consuming, feature-engineering process so that researchers produce accurate student models more quickly and easily. In this paper, we compare two AutoML feature engineering methods in the context of the National Assessment of Educational Progress (NAEP) data mining competition. The…
Descriptors: Accuracy, Learning Analytics, Models, National Competency Tests
Nandakumar, Ratna – 1992
The phenomenon of simultaneous differential item functioning (DIF) amplification and cancellation and the role of the SIBTEST computer program in detecting it were studied. A variety of simulated test data was generated for this purpose. In addition, the following real test data were used: (1) American College Testing program data for 2,115 males…
Descriptors: Black Students, Comparative Testing, Computer Simulation, Computer Software
