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van Rijn, Peter W.; Sinharay, Sandip; Haberman, Shelby J.; Johnson, Matthew S. – Large-scale Assessments in Education, 2016
Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment…
Descriptors: Goodness of Fit, Item Response Theory, Regression (Statistics), National Competency Tests
Harnisch, Delwyn L.; Linn, Robert L. – 1981
Techniques to identify the degree to which a response pattern is unusual and the pattern's relationship to examinee background are presented. Sato's caution index and modified caution index use clusters of items for comparisons of observed performance outcomes and do not require the use of item response theory. Correlation between the indices was…
Descriptors: Educational Assessment, Educational Diagnosis, Error Patterns, Item Analysis