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Sinharay, Sandip; Guo, Zhumei; von Davier, Matthias; Veldkamp, Bernard P. – ETS Research Report Series, 2009
The reporting methods used in large-scale educational assessments such as the National Assessment of Educational Progress (NAEP) rely on a "latent regression model". There is a lack of research on the assessment of fit of latent regression models. This paper suggests a simulation-based model-fit technique to assess the fit of such…
Descriptors: Regression (Statistics), Models, Goodness of Fit, National Competency Tests
Rudner, Lawrence M.; And Others – 1995
Fit statistics provide a direct measure of assessment accuracy by analyzing the fit of measurement models to an individual's (or group's) response pattern. Students that lose interest during the assessment, for example, will miss exercises that are within their abilities. Such students will respond correctly to some more difficult items and…
Descriptors: Difficulty Level, Educational Assessment, Goodness of Fit, Measurement Techniques
Murray, Linda N.; Hambleton, Ronald K. – 1983
The purpose of this research study was to assess item response model-test data fit using residuals. First, a comparison of raw and standardized residuals for describing model-test data fit was carried out. Second, hypotheses concerning the relationship between residual sizes and several item characteristics were studied. The analyses with…
Descriptors: Educational Assessment, Goodness of Fit, Item Analysis, Latent Trait Theory