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Sainan Xu; Jing Lu; Jiwei Zhang; Chun Wang; Gongjun Xu – Grantee Submission, 2024
With the growing attention on large-scale educational testing and assessment, the ability to process substantial volumes of response data becomes crucial. Current estimation methods within item response theory (IRT), despite their high precision, often pose considerable computational burdens with large-scale data, leading to reduced computational…
Descriptors: Educational Assessment, Bayesian Statistics, Statistical Inference, Item Response Theory
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Buyukatak, Emrah; Anil, Duygu – International Journal of Assessment Tools in Education, 2022
The purpose of this research was to determine classification accuracy of the factors affecting the success of students' reading skills based on PISA 2018 data by using Artificial Neural Networks, Decision Trees, K-Nearest Neighbor, and Naive Bayes data mining classification methods and to examine the general characteristics of success groups. In…
Descriptors: Classification, Accuracy, Reading Tests, Achievement Tests
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Hu, Jie; Peng, Yi; Chen, Xiao – IEEE Transactions on Learning Technologies, 2023
The prevalence of information and communication technologies (ICTs) has brought about profound changes in the field of reading, resulting in a large and rapidly growing number of young digital readers. The article intends to identify key contextual factors that synergistically differentiate high and low performers, high and average performers, and…
Descriptors: Decoding (Reading), Educational Technology, Information Technology, Reading Skills
Jing Lu; Chun Wang; Jiwei Zhang; Xue Wang – Grantee Submission, 2023
Changepoints are abrupt variations in a sequence of data in statistical inference. In educational and psychological assessments, it is pivotal to properly differentiate examinees' aberrant behaviors from solution behavior to ensure test reliability and validity. In this paper, we propose a sequential Bayesian changepoint detection algorithm to…
Descriptors: Bayesian Statistics, Behavior Patterns, Computer Assisted Testing, Accuracy