Descriptor
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Educational Forum | 2 |
Author
Vandivier, Phillip L. | 2 |
Vandivier, Stella Sue | 2 |
Publication Type
Journal Articles | 2 |
Opinion Papers | 1 |
Reports - Research | 1 |
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Laws, Policies, & Programs
Assessments and Surveys
Stanford Binet Intelligence… | 2 |
Wechsler Intelligence Scale… | 2 |
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Vandivier, Phillip L.; Vandivier, Stella Sue – Educational Forum, 1979
Discusses the most widely used individual intelligence tests: Wechsler Intelligence Scale for Children (WISC) and Stanford-Binet Intelligence Scale (Form L-M). Covers what the tests measure; psychometric or technical properties of the tests; and how test results are used. (JOW)
Descriptors: Academic Achievement, Academic Aptitude, Background, Disadvantaged Youth

Vandivier, Phillip L.; Vandivier, Stella Sue – Educational Forum, 1979
Arguments and prejudices against the use of individually administered intelligence tests are considered and compared with possible values that may be obtained. Cautions about test score interpretation are discussed. Implications of abolishing intelligence testing are considered and recommendations for effective testing policies are presented. (CTM)
Descriptors: Academic Achievement, Diagnostic Tests, Elementary Secondary Education, Intelligence