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Hsu, Chia-Ling; Chen, Yi-Hsin; Wu, Yi-Jhen – Practical Assessment, Research & Evaluation, 2023
Correct specifications of hierarchical attribute structures in analyses using diagnostic classification models (DCMs) are pivotal because misspecifications can lead to biased parameter estimations and inaccurate classification profiles. This research is aimed to demonstrate DCM analyses with various hierarchical attribute structures via Bayesian…
Descriptors: Bayesian Statistics, Computation, International Assessment, Achievement Tests
Lyu, Weicong; Kim, Jee-Seon; Suk, Youmi – Journal of Educational and Behavioral Statistics, 2023
This article presents a latent class model for multilevel data to identify latent subgroups and estimate heterogeneous treatment effects. Unlike sequential approaches that partition data first and then estimate average treatment effects (ATEs) within classes, we employ a Bayesian procedure to jointly estimate mixing probability, selection, and…
Descriptors: Hierarchical Linear Modeling, Bayesian Statistics, Causal Models, Statistical Inference
Yamaguchi, Kazuhiro – Journal of Educational and Behavioral Statistics, 2023
Understanding whether or not different types of students master various attributes can aid future learning remediation. In this study, two-level diagnostic classification models (DCMs) were developed to represent the probabilistic relationship between external latent classes and attribute mastery patterns. Furthermore, variational Bayesian (VB)…
Descriptors: Bayesian Statistics, Classification, Statistical Inference, Sampling
Kim, Nana; Bolt, Daniel M. – Educational and Psychological Measurement, 2021
This paper presents a mixture item response tree (IRTree) model for extreme response style. Unlike traditional applications of single IRTree models, a mixture approach provides a way of representing the mixture of respondents following different underlying response processes (between individuals), as well as the uncertainty present at the…
Descriptors: Item Response Theory, Response Style (Tests), Models, Test Items
Arenson, Ethan A.; Karabatsos, George – Grantee Submission, 2017
Item response models typically assume that the item characteristic (step) curves follow a logistic or normal cumulative distribution function, which are strictly monotone functions of person test ability. Such assumptions can be overly-restrictive for real item response data. We propose a simple and more flexible Bayesian nonparametric IRT model…
Descriptors: Bayesian Statistics, Item Response Theory, Nonparametric Statistics, Models
Si, Yajuan; Reiter, Jerome P. – Journal of Educational and Behavioral Statistics, 2013
In many surveys, the data comprise a large number of categorical variables that suffer from item nonresponse. Standard methods for multiple imputation, like log-linear models or sequential regression imputation, can fail to capture complex dependencies and can be difficult to implement effectively in high dimensions. We present a fully Bayesian,…
Descriptors: Nonparametric Statistics, Bayesian Statistics, Measurement, Evaluation Methods
Skaggs, Gary; Wilkins, Jesse L. M.; Hein, Serge F. – International Journal of Testing, 2016
The purpose of this study was to explore the degree of grain size of the attributes and the sample sizes that can support accurate parameter recovery with the General Diagnostic Model (GDM) for a large-scale international assessment. In this resampling study, bootstrap samples were obtained from the 2003 Grade 8 TIMSS in Mathematics at varying…
Descriptors: Achievement Tests, Foreign Countries, Elementary Secondary Education, Science Achievement
Huang, Hung-Yu; Wang, Wen-Chung – Educational and Psychological Measurement, 2014
In the social sciences, latent traits often have a hierarchical structure, and data can be sampled from multiple levels. Both hierarchical latent traits and multilevel data can occur simultaneously. In this study, we developed a general class of item response theory models to accommodate both hierarchical latent traits and multilevel data. The…
Descriptors: Item Response Theory, Hierarchical Linear Modeling, Computation, Test Reliability