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Hsu, Chia-Ling; Chen, Yi-Hsin; Wu, Yi-Jhen – Practical Assessment, Research & Evaluation, 2023
Correct specifications of hierarchical attribute structures in analyses using diagnostic classification models (DCMs) are pivotal because misspecifications can lead to biased parameter estimations and inaccurate classification profiles. This research is aimed to demonstrate DCM analyses with various hierarchical attribute structures via Bayesian…
Descriptors: Bayesian Statistics, Computation, International Assessment, Achievement Tests
Lyu, Weicong; Kim, Jee-Seon; Suk, Youmi – Journal of Educational and Behavioral Statistics, 2023
This article presents a latent class model for multilevel data to identify latent subgroups and estimate heterogeneous treatment effects. Unlike sequential approaches that partition data first and then estimate average treatment effects (ATEs) within classes, we employ a Bayesian procedure to jointly estimate mixing probability, selection, and…
Descriptors: Hierarchical Linear Modeling, Bayesian Statistics, Causal Models, Statistical Inference
Yamaguchi, Kazuhiro – Journal of Educational and Behavioral Statistics, 2023
Understanding whether or not different types of students master various attributes can aid future learning remediation. In this study, two-level diagnostic classification models (DCMs) were developed to represent the probabilistic relationship between external latent classes and attribute mastery patterns. Furthermore, variational Bayesian (VB)…
Descriptors: Bayesian Statistics, Classification, Statistical Inference, Sampling
Terzi, Ragip; Sen, Sedat – SAGE Open, 2019
Large-scale assessments are generally designed for summative purposes to compare achievement among participating countries. However, these nondiagnostic assessments have also been adapted in the context of cognitive diagnostic assessment for diagnostic purposes. Following the large amount of investments in these assessments, it would be…
Descriptors: Achievement Tests, Elementary Secondary Education, Foreign Countries, International Assessment
von Davier, Matthias; Tyack, Lillian; Khorramdel, Lale – Educational and Psychological Measurement, 2023
Automated scoring of free drawings or images as responses has yet to be used in large-scale assessments of student achievement. In this study, we propose artificial neural networks to classify these types of graphical responses from a TIMSS 2019 item. We are comparing classification accuracy of convolutional and feed-forward approaches. Our…
Descriptors: Scoring, Networks, Artificial Intelligence, Elementary Secondary Education
Oluwalana, Olasumbo O. – ProQuest LLC, 2019
A primary purpose of cognitive diagnosis models (CDMs) is to classify examinees based on their attribute patterns. The Q-matrix (Tatsuoka, 1985), a common component of all CDMs, specifies the relationship between the set of required dichotomous attributes and the test items. Since a Q-matrix is often developed by content-knowledge experts and can…
Descriptors: Classification, Validity, Test Items, International Assessment
Hansen, Mark; Cai, Li; Monroe, Scott; Li, Zhen – National Center for Research on Evaluation, Standards, and Student Testing (CRESST), 2014
It is a well-known problem in testing the fit of models to multinomial data that the full underlying contingency table will inevitably be sparse for tests of reasonable length and for realistic sample sizes. Under such conditions, full-information test statistics such as Pearson's X[superscript 2] and the likelihood ratio statistic G[superscript…
Descriptors: Goodness of Fit, Item Response Theory, Classification, Maximum Likelihood Statistics
Hansen, Mark; Cai, Li; Monroe, Scott; Li, Zhen – Grantee Submission, 2016
Despite the growing popularity of diagnostic classification models (e.g., Rupp, Templin, & Henson, 2010) in educational and psychological measurement, methods for testing their absolute goodness-of-fit to real data remain relatively underdeveloped. For tests of reasonable length and for realistic sample size, full-information test statistics…
Descriptors: Goodness of Fit, Item Response Theory, Classification, Maximum Likelihood Statistics