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Hansen, Mark; Cai, Li; Monroe, Scott; Li, Zhen – National Center for Research on Evaluation, Standards, and Student Testing (CRESST), 2014
It is a well-known problem in testing the fit of models to multinomial data that the full underlying contingency table will inevitably be sparse for tests of reasonable length and for realistic sample sizes. Under such conditions, full-information test statistics such as Pearson's X[superscript 2] and the likelihood ratio statistic G[superscript…
Descriptors: Goodness of Fit, Item Response Theory, Classification, Maximum Likelihood Statistics
Hansen, Mark; Cai, Li; Monroe, Scott; Li, Zhen – Grantee Submission, 2016
Despite the growing popularity of diagnostic classification models (e.g., Rupp, Templin, & Henson, 2010) in educational and psychological measurement, methods for testing their absolute goodness-of-fit to real data remain relatively underdeveloped. For tests of reasonable length and for realistic sample size, full-information test statistics…
Descriptors: Goodness of Fit, Item Response Theory, Classification, Maximum Likelihood Statistics
Su, Yu-Lan – ProQuest LLC, 2013
This dissertation proposes two modified cognitive diagnostic models (CDMs), the deterministic, inputs, noisy, "and" gate with hierarchy (DINA-H) model and the deterministic, inputs, noisy, "or" gate with hierarchy (DINO-H) model. Both models incorporate the hierarchical structures of the cognitive skills in the model estimation…
Descriptors: Models, Diagnostic Tests, Cognitive Processes, Thinking Skills
Huang, Hung-Yu; Wang, Wen-Chung – Educational and Psychological Measurement, 2014
In the social sciences, latent traits often have a hierarchical structure, and data can be sampled from multiple levels. Both hierarchical latent traits and multilevel data can occur simultaneously. In this study, we developed a general class of item response theory models to accommodate both hierarchical latent traits and multilevel data. The…
Descriptors: Item Response Theory, Hierarchical Linear Modeling, Computation, Test Reliability