Publication Date
In 2025 | 0 |
Since 2024 | 0 |
Since 2021 (last 5 years) | 0 |
Since 2016 (last 10 years) | 0 |
Since 2006 (last 20 years) | 3 |
Descriptor
Publication Type
Journal Articles | 3 |
Reports - Research | 3 |
Education Level
Elementary Secondary Education | 2 |
Grade 8 | 1 |
Junior High Schools | 1 |
Middle Schools | 1 |
Secondary Education | 1 |
Audience
Location
Tunisia | 1 |
Laws, Policies, & Programs
Assessments and Surveys
Trends in International… | 3 |
National Assessment of… | 1 |
Program for International… | 1 |
Progress in International… | 1 |
What Works Clearinghouse Rating
Rutkowski, Leslie – Applied Measurement in Education, 2014
Large-scale assessment programs such as the National Assessment of Educational Progress (NAEP), Trends in International Mathematics and Science Study (TIMSS), and Programme for International Student Assessment (PISA) use a sophisticated assessment administration design called matrix sampling that minimizes the testing burden on individual…
Descriptors: Measurement, Testing, Item Sampling, Computation
Svetina, Dubravka; Rutkowski, Leslie – Large-scale Assessments in Education, 2014
Background: When studying student performance across different countries or cultures, an important aspect for comparisons is that of score comparability. In other words, it is imperative that the latent variable (i.e., construct of interest) is understood and measured equivalently across all participating groups or countries, if our inferences…
Descriptors: Test Items, Item Response Theory, Item Analysis, Regression (Statistics)
Bouhlila, Donia Smaali; Sellaouti, Fethi – Large-scale Assessments in Education, 2013
In this paper, we document a study that involved applying a multiple imputation technique with chained equations to data drawn from the 2007 iteration of the TIMSS database. More precisely, we imputed missing variables contained in the student background datafile for Tunisia (one of the TIMSS 2007 participating countries), by using Van Buuren,…
Descriptors: Databases, Student Characteristics, Error of Measurement, Intervals