ERIC Number: EJ1405826
Record Type: Journal
Publication Date: 2024
Pages: 29
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-1076-9986
EISSN: EISSN-1935-1054
Available Date: N/A
Chance-Constrained Automated Test Assembly
Giada Spaccapanico Proietti; Mariagiulia Matteucci; Stefania Mignani; Bernard P. Veldkamp
Journal of Educational and Behavioral Statistics, v49 n1 p92-120 2024
Classical automated test assembly (ATA) methods assume fixed and known coefficients for the constraints and the objective function. This hypothesis is not true for the estimates of item response theory parameters, which are crucial elements in test assembly classical models. To account for uncertainty in ATA, we propose a chance-constrained version of the maximin ATA model, which allows maximizing the a-quantile of the sampling distribution of the test information function obtained by applying the bootstrap on the item parameter estimation. A heuristic inspired by the simulated annealing optimization technique is implemented to solve the ATA model. The validity of the proposed approach is empirically demonstrated by a simulation study. The applicability is proven by using the real responses to the Trends in International Mathematics and Science Study (TIMSS) 2015 science test.
Descriptors: Automation, Computer Assisted Testing, Ambiguity (Context), Item Response Theory, Test Construction, Sampling, Statistical Distributions, Heuristics, Validity, Simulation, Science Tests, Achievement Tests, Elementary Secondary Education, Science Achievement, International Assessment, Foreign Countries, Mathematics Tests, Mathematics Achievement
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Publication Type: Journal Articles; Reports - Research
Education Level: Elementary Secondary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Assessments and Surveys: Trends in International Mathematics and Science Study
Grant or Contract Numbers: N/A
Author Affiliations: N/A