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General Aptitude Test Battery1
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Davison, Mark L.; And Others – Psychological Assessment, 1996
Results of profile analysis via multidimensional scaling (PAMS), a technique for studying the most prominent profiles in a battery of measures, are reported for the Wechsler Adult Intelligence Scale--Revised (WAIS) and the General Aptitude Test Battery (GATB). PAMS profiles and the methodological features of the PAMS approach are discussed. (SLD)
Descriptors: Aptitude Tests, Intelligence Tests, Multidimensional Scaling, Profiles