Peer reviewedERIC Number: EJ531719
Record Type: Journal
Publication Date: 1996
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: ISSN-1040-3590
EISSN: N/A
Available Date: N/A
Identifying Major Profile Patterns in a Population: An Exploratory Study of WAIS and GATB Patterns.
Davison, Mark L.; And Others
Psychological Assessment, v8 n1 p26-31 Mar 1996
Results of profile analysis via multidimensional scaling (PAMS), a technique for studying the most prominent profiles in a battery of measures, are reported for the Wechsler Adult Intelligence Scale--Revised (WAIS) and the General Aptitude Test Battery (GATB). PAMS profiles and the methodological features of the PAMS approach are discussed. (SLD)
Descriptors: Aptitude Tests, Intelligence Tests, Multidimensional Scaling, Profiles, Test Results, Test Use
Publication Type: Reports - Evaluative; Journal Articles
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Assessments and Surveys: General Aptitude Test Battery; Wechsler Adult Intelligence Scale
Grant or Contract Numbers: N/A
Author Affiliations: N/A
