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Blackwell, Matthew; Honaker, James; King, Gary – Sociological Methods & Research, 2017
We extend a unified and easy-to-use approach to measurement error and missing data. In our companion article, Blackwell, Honaker, and King give an intuitive overview of the new technique, along with practical suggestions and empirical applications. Here, we offer more precise technical details, more sophisticated measurement error model…
Descriptors: Error of Measurement, Correlation, Simulation, Bayesian Statistics
Enders, Craig K. – Guilford Press, 2010
Walking readers step by step through complex concepts, this book translates missing data techniques into something that applied researchers and graduate students can understand and utilize in their own research. Enders explains the rationale and procedural details for maximum likelihood estimation, Bayesian estimation, multiple imputation, and…
Descriptors: Data Analysis, Error of Measurement, Research Problems, Maximum Likelihood Statistics
del Pino, Guido; San Martin, Ernesto; Gonzalez, Jorge; De Boeck, Paul – Psychometrika, 2008
This paper analyzes the sum score based (SSB) formulation of the Rasch model, where items and sum scores of persons are considered as factors in a logit model. After reviewing the evolution leading to the equality between their maximum likelihood estimates, the SSB model is then discussed from the point of view of pseudo-likelihood and of…
Descriptors: Computation, Models, Scores, Evaluation Methods
Finch, Holmes; Monahan, Patrick – Applied Measurement in Education, 2008
This article introduces a bootstrap generalization to the Modified Parallel Analysis (MPA) method of test dimensionality assessment using factor analysis. This methodology, based on the use of Marginal Maximum Likelihood nonlinear factor analysis, provides for the calculation of a test statistic based on a parametric bootstrap using the MPA…
Descriptors: Monte Carlo Methods, Factor Analysis, Generalization, Methods

Yen, Wendy M. – Journal of Educational Measurement, 1984
A procedure for obtaining maximum likelihood trait estimates from number-correct (NC) scores for the three-parameter logistic model is presented. It produces an NC score to trait estimate conversion table. Analyses in the estimated true score metric confirm the conclusions made in the trait metric. (Author/DWH)
Descriptors: Achievement Tests, Error of Measurement, Estimation (Mathematics), Latent Trait Theory
Wingersky, Marilyn S.; Lord, Frederic M. – 1983
The sampling errors of maximum likelihood estimates of item-response theory parameters are studied in the case where both people and item parameters are estimated simultaneously. A check on the validity of the standard error formulas is carried out. The effect of varying sample size, test length, and the shape of the ability distribution is…
Descriptors: Error of Measurement, Estimation (Mathematics), Item Banks, Latent Trait Theory
Jones, Douglas H.; And Others – 1984
How accurately ability is estimated when the test model does not fit the data is considered. To address this question, this study investigated the accuracy of the maximum likelihood estimator of ability for the one-, two- and three-parameter logistic (PL) models. The models were fitted into generated item characteristic curves derived from the…
Descriptors: Ability, Aptitude Tests, Error of Measurement, Estimation (Mathematics)
Wolfle, Lee M.; Ethington, Corinna A. – 1984
To correct for the effects of measurement error on structural parameter estimates, many researchers are now estimating models of educational achievement with LISREL. In order to estimate such models it is desirable to obtain multiple manifest measures of the latent constructs. Many researchers restrict their models to two manifest measures per…
Descriptors: Academic Achievement, Error of Measurement, Estimation (Mathematics), Goodness of Fit