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Gierl, Mark J.; Lai, Hollis – Educational Measurement: Issues and Practice, 2013
Changes to the design and development of our educational assessments are resulting in the unprecedented demand for a large and continuous supply of content-specific test items. One way to address this growing demand is with automatic item generation (AIG). AIG is the process of using item models to generate test items with the aid of computer…
Descriptors: Educational Assessment, Test Items, Automation, Computer Assisted Testing
Gierl, Mark J.; Lai, Hollis – Educational Measurement: Issues and Practice, 2016
Testing organization needs large numbers of high-quality items due to the proliferation of alternative test administration methods and modern test designs. But the current demand for items far exceeds the supply. Test items, as they are currently written, evoke a process that is both time-consuming and expensive because each item is written,…
Descriptors: Test Items, Test Construction, Psychometrics, Models

Gierl, Mark J.; Leighton, Jacqueline P.; Hunka, Stephen M. – Educational Measurement: Issues and Practice, 2000
Discusses the logic of the rule-space model (K. Tatsuoka, 1983) as it applies to test development and analysis. The rule-space model is a statistical method for classifying examinees' test item responses into a set of attribute-mastery patterns associated with different cognitive skills. Directs readers to a tutorial that may be downloaded. (SLD)
Descriptors: Item Analysis, Item Response Theory, Test Construction, Test Items
Gierl, Mark J. – Educational Measurement: Issues and Practice, 2005
In this paper I describe and illustrate the Roussos-Stout (1996) multidimensionality-based DIF analysis paradigm, with emphasis on its implication for the selection of a matching and studied subtest for DIF analyses. Standard DIF practice encourages an exploratory search for matching subtest items based on purely statistical criteria, such as a…
Descriptors: Models, Test Items, Test Bias, Statistical Analysis