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Huynh, Huynh – Journal of Educational Statistics, 1990
False positive and false negative error rates were studied for competency testing when failing examinees are permitted to retake the test. Formulas are provided for the beta-binomial and Rasch models. Estimates based on these models are compared for six data sets from the South Carolina Basic Skills Assessment Program. (SLD)
Descriptors: Elementary Secondary Education, Equations (Mathematics), Error Patterns, Estimation (Mathematics)
Huynh, Huynh; Casteel, Jim – 1983
This report deals with ways to report basic skills test data which would facilitate the identification of student weaknesses. Under study are the technical aspects and methods associated with the reporting of objective-referenced data. An exploration is then made into the use of patterns of errors in responding to basic skills test items to…
Descriptors: Academic Achievement, Basic Skills, Educational Diagnosis, Educational Research