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Direct linkSu, Shiyang; Wang, Chun; Weiss, David J. – Educational and Psychological Measurement, 2021
S-X[superscript 2] is a popular item fit index that is available in commercial software packages such as "flex"MIRT. However, no research has systematically examined the performance of S-X[superscript 2] for detecting item misfit within the context of the multidimensional graded response model (MGRM). The primary goal of this study was…
Descriptors: Statistics, Goodness of Fit, Test Items, Models
Download full textWeiss, David J.; McBride, James R. – 1983
Monte Carlo simulation was used to investigate score bias and information characteristics of Owen's Bayesian adaptive testing strategy, and to examine possible causes of score bias. Factors investigated in three related studies included effects of item discrimination, effects of fixed vs. variable test length, and effects of an accurate prior…
Descriptors: Ability Identification, Adaptive Testing, Bayesian Statistics, Computer Assisted Testing
Maurelli, Vincent A.; Weiss, David J. – 1981
A monte carlo simulation was conducted to assess the effects in an adaptive testing strategy for test batteries of varying subtest order, subtest termination criterion, and variable versus fixed entry on the psychometric properties of an existent achievement test battery. Comparisons were made among conventionally administered tests and adaptive…
Descriptors: Achievement Tests, Adaptive Testing, Computer Assisted Testing, Latent Trait Theory
