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| Applied Measurement in… | 1 |
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Wise, Steven L. – Applied Measurement in Education, 2006
In low-stakes testing, the motivation levels of examinees are often a matter of concern to test givers because a lack of examinee effort represents a direct threat to the validity of the test data. This study investigated the use of response time to assess the amount of examinee effort received by individual test items. In 2 studies, it was found…
Descriptors: Computer Assisted Testing, Motivation, Test Validity, Item Response Theory

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