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van der Linden, Wim J.; Ren, Hao – Journal of Educational and Behavioral Statistics, 2020
The Bayesian way of accounting for the effects of error in the ability and item parameters in adaptive testing is through the joint posterior distribution of all parameters. An optimized Markov chain Monte Carlo algorithm for adaptive testing is presented, which samples this distribution in real time to score the examinee's ability and optimally…
Descriptors: Bayesian Statistics, Adaptive Testing, Error of Measurement, Markov Processes
van der Linden, Wim J.; Glas, Cees A. W. – 1998
In adaptive testing, item selection is sequentially optimized during the test. Since the optimization takes place over a pool of items calibrated with estimation error, capitalization on these errors is likely to occur. How serious the consequences of this phenomenon are depends not only on the distribution of the estimation errors in the pool or…
Descriptors: Ability, Adaptive Testing, Computer Assisted Testing, Error of Measurement
van der Linden, Wim J. – 1996
R. J. Owen (1975) proposed an approximate empirical Bayes procedure for item selection in adaptive testing. The procedure replaces the true posterior by a normal approximation with closed-form expressions for its first two moments. This approximation was necessary to minimize the computational complexity involved in a fully Bayesian approach, but…
Descriptors: Ability, Adaptive Testing, Bayesian Statistics, Computation
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van der Linden, Wim J. – Applied Psychological Measurement, 2006
Two local methods for observed-score equating are applied to the problem of equating an adaptive test to a linear test. In an empirical study, the methods were evaluated against a method based on the test characteristic function (TCF) of the linear test and traditional equipercentile equating applied to the ability estimates on the adaptive test…
Descriptors: Adaptive Testing, Computer Assisted Testing, Test Format, Equated Scores