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Chang, Hua-Hua; van der Linden, Wim J. – Applied Psychological Measurement, 2003
Developed a method based on 0-1 linear programming to stratify an item pool optimally for use in alpha-stratified adaptive testing. Applied the method to a previous item pool from the computerized adaptive test of the Graduate Record Examinations. Results show the new method performs well in practical situations. (SLD)
Descriptors: Adaptive Testing, Computer Assisted Testing, Item Banks, Linear Programming
Peer reviewed Peer reviewed
van der Linden, Wim J.; Adema, Jos J. – Journal of Educational Measurement, 1998
Proposes an algorithm for the assembly of multiple test forms in which the multiple-form problem is reduced to a series of computationally less intensive two-form problems. Illustrates how the method can be implemented using 0-1 linear programming and gives two examples. (SLD)
Descriptors: Algorithms, Linear Programming, Test Construction, Test Format
van der Linden, Wim J.; Carlson, James E. – 1999
A popular design in large-scale educational assessments is the balanced incomplete block design. The design assumes that the item pool is split into a set of blocks of items that are assigned to assessment booklets. This paper shows how the technique of 0-1 linear programming can be used to calculate a balanced incomplete block design. Several…
Descriptors: Educational Assessment, Item Banks, Linear Programming, Research Design
Peer reviewed Peer reviewed
van der Linden, Wim J. – Applied Psychological Measurement, 1998
Reviews optimal test-assembly literature and introduces the contributions to this special issue. Discusses four approaches to computerized test assembly: (1) heuristic-based test assembly; (2) 0-1 linear programming; (3) network-flow programming; and (4) an optimal design approach. Contains a bibliography of 90 sources on test assembly.…
Descriptors: Adaptive Testing, Computer Assisted Testing, Heuristics, Linear Programming
van der Linden, Wim J.; Adema, Jos J. – 1997
An algorithm for the assembly of multiple test forms is proposed in which the multiple-form problem is reduced to a series of computationally less intensive two-form problems. At each step one form is assembled to its true specifications; the other form is a dummy assembled only to maintain a balance between the quality of the current form and the…
Descriptors: Algorithms, Foreign Countries, Higher Education, Linear Programming
Peer reviewed Peer reviewed
van der Linden, Wim J.; Reese, Lynda M. – Applied Psychological Measurement, 1998
Proposes a model for constrained computerized adaptive testing in which the information in the test at the trait level (theta) estimate is maximized subject to the number of possible constraints on the content of the test. Test assembly relies on a linear-programming approach. Illustrates the approach through simulation with items from the Law…
Descriptors: Ability, Adaptive Testing, Computer Assisted Testing, Estimation (Mathematics)
van der Linden, Wim J. – 2000
A method based on 0-1 linear programming (LP) is presented to stratify an item pool optimally for use in "alpha"-stratified adaptive testing. Because the 0-1 LP model belongs to the subclass of models with a network-flow structure, efficient solutions are possible. The method is applied to a previous item pool from the computerized…
Descriptors: Adaptive Testing, Computer Assisted Testing, Item Banks, Linear Programming
van der Linden, Wim J.; Scrams, David J.; Schnipke, Deborah L. – 2003
This paper proposes an item selection algorithm that can be used to neutralize the effect of time limits in computer adaptive testing. The method is based on a statistical model for the response-time distributions of the test takers on the items in the pool that is updated each time a new item has been administered. Predictions from the model are…
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Linear Programming
van der Linden, Wim J.; Luecht, Richard M. – 1997
A set of linear conditions on the item response functions is derived that guarantees identical observed-score distributions on two test forms. The conditions can be added as constraints to a linear programming model for test assembly that assembles a new test form to have an observed-score distribution optimally equated to the distribution of the…
Descriptors: Equated Scores, Foreign Countries, Higher Education, Item Response Theory
Peer reviewed Peer reviewed
van der Linden, Wim J.; Luecht, Richard M. – Psychometrika, 1998
Derives a set of linear conditions of item-response functions that guarantees identical observed-score distributions on two test forms. The conditions can be added as constraints to a linear programming model for test assembly. An example illustrates the use of the model for an item pool from the Law School Admissions Test (LSAT). (SLD)
Descriptors: Equated Scores, Item Banks, Item Response Theory, Linear Programming
van der Linden, Wim J.; Luecht, Richard M. – 1994
An optimization model is presented that allows test assemblers to control the shape of the observed-score distribution on a test for a population with a known ability distribution. An obvious application is for item response theory-based test assembly in programs where observed scores are reported and operational test forms are required to produce…
Descriptors: Ability, Foreign Countries, Heuristics, Item Response Theory
van der Linden, Wim J.; Scrams, David J.; Schnipke, Deborah L. – 1998
An item-selection algorithm to neutralize the differential effects of time limits on scores on computerized adaptive tests is proposed. The method is based on a statistical model for the response-time distributions of the examinees on items in the pool that is updated each time a new item has been administered. Predictions from the model are used…
Descriptors: Adaptive Testing, Algorithms, Computer Assisted Testing, Foreign Countries
van der Linden, Wim J. – 1998
The advent of computers in educational and psychological measurement has lead to the need for algorithms for optimal assembly of tests from item banks. This paper reviews the literature on optimal test assembly and introduces the contributions to this report on the topic. Four different approaches to computerized test assembly are discussed:…
Descriptors: Algorithms, Computer Assisted Testing, Educational Testing, Equated Scores