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van der Linden, Wim J. – 1980
Latent class models for mastery testing differ from continuum models in that they do not postulate a latent mastery continuum but conceive mastery and non-mastery as two latent classes, each characterized by different probabilities of success. Several researchers use a simple latent class model that is basically a simultaneous application of the…
Descriptors: Cutting Scores, Error Patterns, Estimation (Mathematics), Foreign Countries
van der Linden, Wim J. – 1982
A latent trait method is presented to investigate the possibility that Angoff or Nedelsky judges specify inconsistent probabilities in standard setting techniques for objectives-based instructional programs. It is suggested that judges frequently specify a low probability of success for an easy item but a large probability for a hard item. The…
Descriptors: Criterion Referenced Tests, Cutting Scores, Error of Measurement, Interrater Reliability