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Download full textvon Davier, Matthias; Xu, Xueli; Carstensen, Claus H. – Educational Testing Service, 2009
A general diagnostic model was used to specify and compare two multidimensional item-response-theory (MIRT) models for longitudinal data: (a) a model that handles repeated measurements as multiple, correlated variables over time (Andersen, 1985) and (b) a model that assumes one common variable over time and additional orthogonal variables that…
Descriptors: Models, Item Response Theory, Longitudinal Studies, Measurement
Peer reviewedXu, Xueli; von Davier, Matthias – ETS Research Report Series, 2008
Xu and von Davier (2006) demonstrated the feasibility of using the general diagnostic model (GDM) to analyze National Assessment of Educational Progress (NAEP) proficiency data. Their work showed that the GDM analysis not only led to conclusions for gender and race groups similar to those published in the NAEP Report Card, but also allowed…
Descriptors: National Competency Tests, Models, Data Analysis, Reading Tests
Xu, Xueli; von Davier, Matthias – ETS Research Report Series, 2006
More than a dozen statistical models have been developed for the purpose of cognitive diagnosis. These models are supposed to extract a much finer level of information from item responses than traditional unidimensional item response models. In this paper, a general diagnostic model (GDM) was used to analyze a set of simulated sparse data and real…
Descriptors: Statistical Analysis, National Competency Tests, Diagnostic Tests, Item Response Theory
