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Xu, Xueli; von Davier, Matthias – ETS Research Report Series, 2006
More than a dozen statistical models have been developed for the purpose of cognitive diagnosis. These models are supposed to extract a much finer level of information from item responses than traditional unidimensional item response models. In this paper, a general diagnostic model (GDM) was used to analyze a set of simulated sparse data and real…
Descriptors: Statistical Analysis, National Competency Tests, Diagnostic Tests, Item Response Theory
von Davier, Matthias – ETS Research Report Series, 2005
Probabilistic models with more than one latent variable are designed to report profiles of skills or cognitive attributes. Testing programs want to offer additional information beyond what a single test score can provide using these skill profiles. Many recent approaches to skill profile models are limited to dichotomous data and have made use of…
Descriptors: Models, Diagnostic Tests, Language Tests, Language Proficiency