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Fan, Yi; Lance, Charles E. – Educational and Psychological Measurement, 2017
The correlated trait-correlated method (CTCM) model for the analysis of multitrait-multimethod (MTMM) data is known to suffer convergence and admissibility (C&A) problems. We describe a little known and seldom applied reparameterized version of this model (CTCM-R) based on Rindskopf's reparameterization of the simpler confirmatory factor…
Descriptors: Multitrait Multimethod Techniques, Correlation, Goodness of Fit, Models
Convergence, Admissibility, and Fit of Alternative Confirmatory Factor Analysis Models for MTMM Data
Lance, Charles E.; Fan, Yi – Educational and Psychological Measurement, 2016
We compared six different analytic models for multitrait-multimethod (MTMM) data in terms of convergence, admissibility, and model fit to 258 samples of previously reported data. Two well-known models, the correlated trait-correlated method (CTCM) and the correlated trait-correlated uniqueness (CTCU) models, were fit for reference purposes in…
Descriptors: Multitrait Multimethod Techniques, Factor Analysis, Models, Goodness of Fit
Park, Siwon – Journal of Pan-Pacific Association of Applied Linguistics, 2017
This paper examines how different test methods may tap different aspects of second language knowledge. It employs multiple-choice (MC) and constructed response (CR) items which yield distinct or convergent information in the computer delivered testing of English in its presentation of this factor. In order to examine the effects of test method, a…
Descriptors: Evaluation Methods, Second Language Learning, English (Second Language), Computer Assisted Testing