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Pan, Yiqin; Livne, Oren; Wollack, James A.; Sinharay, Sandip – Educational Measurement: Issues and Practice, 2023
In computerized adaptive testing, overexposure of items in the bank is a serious problem and might result in item compromise. We develop an item selection algorithm that utilizes the entire bank well and reduces the overexposure of items. The algorithm is based on collaborative filtering and selects an item in two stages. In the first stage, a set…
Descriptors: Computer Assisted Testing, Adaptive Testing, Test Items, Algorithms
Bennett, Randy E.; Zhang, Mo; Sinharay, Sandip; Guo, Hongwen; Deane, Paul – Educational Measurement: Issues and Practice, 2022
Grouping individuals according to a set of measured characteristics, or profiling, is frequently used in describing, understanding, and acting on a phenomenon. The advent of computer-based assessment offers new possibilities for profiling writing because aspects can be captured that were not heretofore observable. We explored whether writing…
Descriptors: Computer Assisted Testing, Adults, High School Equivalency Programs, Tests
Sinharay, Sandip – Educational Measurement: Issues and Practice, 2021
Technical difficulties occasionally lead to missing item scores and hence to incomplete data on computerized tests. It is not straightforward to report scores to the examinees whose data are incomplete due to technical difficulties. Such reporting essentially involves imputation of missing scores. In this paper, a simulation study based on data…
Descriptors: Data Analysis, Scores, Educational Assessment, Educational Testing
Sinharay, Sandip – Educational and Psychological Measurement, 2022
Administrative problems such as computer malfunction and power outage occasionally lead to missing item scores and hence to incomplete data on mastery tests such as the AP and U.S. Medical Licensing examinations. Investigators are often interested in estimating the probabilities of passing of the examinees with incomplete data on mastery tests.…
Descriptors: Mastery Tests, Computer Assisted Testing, Probability, Test Wiseness