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Tae Yeon Kwon; A. Corinne Huggins-Manley; Jonathan Templin; Mingying Zheng – Journal of Educational Measurement, 2024
In classroom assessments, examinees can often answer test items multiple times, resulting in sequential multiple-attempt data. Sequential diagnostic classification models (DCMs) have been developed for such data. As student learning processes may be aligned with a hierarchy of measured traits, this study aimed to develop a sequential hierarchical…
Descriptors: Classification, Accuracy, Student Evaluation, Sequential Approach
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Tae Yeon Kwon; A. Corinne Huggins-Manley; Jonathan Templin; Mingying Zheng – Grantee Submission, 2023
In classroom assessments, examinees can often answer test items multiple times, resulting in sequential multiple-attempt data. Sequential diagnostic classification models (DCMs) have been developed for such data. As student learning processes may be aligned with a hierarchy of measured traits, this study aimed to develop a sequential hierarchical…
Descriptors: Classification, Accuracy, Student Evaluation, Sequential Approach
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Zhan, Peida; Liu, Yaohui; Yu, Zhaohui; Pan, Yanfang – Applied Measurement in Education, 2023
Many educational and psychological studies have shown that the development of students is generally step-by-step (i.e. ordinal development) to a specific level. This study proposed a novel longitudinal learning diagnosis model with polytomous attributes to track students' ordinal development in learning. Using the concept of polytomous attributes…
Descriptors: Skill Development, Cognitive Measurement, Models, Educational Diagnosis
Haimiao Yuan – ProQuest LLC, 2022
The application of diagnostic classification models (DCMs) in the field of educational measurement is getting more attention in recent years. To make a valid inference from the model, it is important to ensure that the model fits the data. The purpose of the present study was to investigate the performance of the limited information…
Descriptors: Goodness of Fit, Educational Assessment, Educational Diagnosis, Models