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Lei Guo; Wenjie Zhou; Xiao Li – Journal of Educational and Behavioral Statistics, 2024
The testlet design is very popular in educational and psychological assessments. This article proposes a new cognitive diagnosis model, the multiple-choice cognitive diagnostic testlet (MC-CDT) model for tests using testlets consisting of MC items. The MC-CDT model uses the original examinees' responses to MC items instead of dichotomously scored…
Descriptors: Multiple Choice Tests, Diagnostic Tests, Accuracy, Computer Software
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Xiao, Yue; He, Qiwei; Veldkamp, Bernard; Liu, Hongyun – Journal of Computer Assisted Learning, 2021
The response process of problem-solving items contains rich information about respondents' behaviours and cognitive process in the digital tasks, while the information extraction is a big challenge. The aim of the study is to use a data-driven approach to explore the latent states and state transitions underlying problem-solving process to reflect…
Descriptors: Problem Solving, Competence, Markov Processes, Test Wiseness
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Yu, Albert; Douglas, Jeffrey A. – Journal of Educational and Behavioral Statistics, 2023
We propose a new item response theory growth model with item-specific learning parameters, or ISLP, and two variations of this model. In the ISLP model, either items or blocks of items have their own learning parameters. This model may be used to improve the efficiency of learning in a formative assessment. We show ways that the ISLP model's…
Descriptors: Item Response Theory, Learning, Markov Processes, Monte Carlo Methods
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Lozano, José H.; Revuelta, Javier – Educational and Psychological Measurement, 2023
The present paper introduces a general multidimensional model to measure individual differences in learning within a single administration of a test. Learning is assumed to result from practicing the operations involved in solving the items. The model accounts for the possibility that the ability to learn may manifest differently for correct and…
Descriptors: Bayesian Statistics, Learning Processes, Test Items, Item Analysis
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Qiao, Xin; Jiao, Hong – Journal of Educational Measurement, 2021
This study proposes explanatory cognitive diagnostic model (CDM) jointly incorporating responses and response times (RTs) with the inclusion of item covariates related to both item responses and RTs. The joint modeling of item responses and RTs intends to provide more information for cognitive diagnosis while item covariates can be used to predict…
Descriptors: Cognitive Measurement, Models, Reaction Time, Test Items
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Patel, Nirmal; Sharma, Aditya; Shah, Tirth; Lomas, Derek – Journal of Educational Data Mining, 2021
Process Analysis is an emerging approach to discover meaningful knowledge from temporal educational data. The study presented in this paper shows how we used Process Analysis methods on the National Assessment of Educational Progress (NAEP) test data for modeling and predicting student test-taking behavior. Our process-oriented data exploration…
Descriptors: Learning Analytics, National Competency Tests, Evaluation Methods, Prediction
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Ross, Matthew M.; Wright, A. Michelle – Journal of Education for Business, 2022
We use Markov chain Monte Carlo (MCMC) analysis to construct a three-question math quiz to assess key skills needed for introductory finance. We begin with data collected from a ten-question criterion-referenced math quiz given to 314 undergraduates on the first day of class. MCMC indicates the top three questions for predicting overall course…
Descriptors: Mathematics Tests, Markov Processes, Monte Carlo Methods, Introductory Courses
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Trendtel, Matthias; Robitzsch, Alexander – Journal of Educational and Behavioral Statistics, 2021
A multidimensional Bayesian item response model is proposed for modeling item position effects. The first dimension corresponds to the ability that is to be measured; the second dimension represents a factor that allows for individual differences in item position effects called persistence. This model allows for nonlinear item position effects on…
Descriptors: Bayesian Statistics, Item Response Theory, Test Items, Test Format
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Feng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating