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Direct linkRussell, Michael; Szendey, Olivia; Kaplan, Larry – Educational Assessment, 2021
Differential Item Function (DIF) analysis is commonly employed to examine potential bias produced by a test item. Since its introduction DIF analyses have focused on potential bias related to broad categories of oppression, including gender, racial stratification, economic class, and ableness. More recently, efforts to examine the effects of…
Descriptors: Test Bias, Achievement Tests, Individual Characteristics, Disadvantaged
