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Bosch, Nigel – Journal of Educational Data Mining, 2021
Automatic machine learning (AutoML) methods automate the time-consuming, feature-engineering process so that researchers produce accurate student models more quickly and easily. In this paper, we compare two AutoML feature engineering methods in the context of the National Assessment of Educational Progress (NAEP) data mining competition. The…
Descriptors: Accuracy, Learning Analytics, Models, National Competency Tests
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Sao Pedro, Michael A.; Baker, Ryan S. J. d.; Gobert, Janice D. – Grantee Submission, 2013
When validating assessment models built with data mining, generalization is typically tested at the student-level, where models are tested on new students. This approach, though, may fail to find cases where model performance suffers if other aspects of those cases relevant to prediction are not well represented. We explore this here by testing if…
Descriptors: Educational Research, Data Collection, Data Analysis, Generalizability Theory
Feng, Mingyu; Beck, Joseph E.; Heffernan, Neil T. – International Working Group on Educational Data Mining, 2009
A basic question of instructional interventions is how effective it is in promoting student learning. This paper presents a study to determine the relative efficacy of different instructional strategies by applying an educational data mining technique, learning decomposition. We use logistic regression to determine how much learning is caused by…
Descriptors: Data Analysis, Intelligent Tutoring Systems, Sampling, Statistical Inference
Barnes, Tiffany, Ed.; Desmarais, Michel, Ed.; Romero, Cristobal, Ed.; Ventura, Sebastian, Ed. – International Working Group on Educational Data Mining, 2009
The Second International Conference on Educational Data Mining (EDM2009) was held at the University of Cordoba, Spain, on July 1-3, 2009. EDM brings together researchers from computer science, education, psychology, psychometrics, and statistics to analyze large data sets to answer educational research questions. The increase in instrumented…
Descriptors: Data Analysis, Educational Research, Conferences (Gatherings), Foreign Countries