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Forrow, Lauren; Starling, Jennifer; Gill, Brian – Regional Educational Laboratory Mid-Atlantic, 2023
The Every Student Succeeds Act requires states to identify schools with low-performing student subgroups for Targeted Support and Improvement or Additional Targeted Support and Improvement. Random differences between students' true abilities and their test scores, also called measurement error, reduce the statistical reliability of the performance…
Descriptors: At Risk Students, Low Achievement, Error of Measurement, Measurement Techniques
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Regional Educational Laboratory Mid-Atlantic, 2023
This Snapshot highlights key findings from a study that used Bayesian stabilization to improve the reliability (long-term stability) of subgroup proficiency measures that the Pennsylvania Department of Education (PDE) uses to identify schools for Targeted Support and Improvement (TSI) or Additional Targeted Support and Improvement (ATSI). The…
Descriptors: At Risk Students, Low Achievement, Error of Measurement, Measurement Techniques
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Regional Educational Laboratory Mid-Atlantic, 2023
The "Stabilizing Subgroup Proficiency Results to Improve the Identification of Low-Performing Schools" study used Bayesian stabilization to improve the reliability (long-term stability) of subgroup proficiency measures that the Pennsylvania Department of Education (PDE) uses to identify schools for Targeted Support and Improvement (TSI)…
Descriptors: At Risk Students, Low Achievement, Error of Measurement, Measurement Techniques
Choi, Kilchan; Kim, Jinok – Journal of Educational and Behavioral Statistics, 2019
This article proposes a latent variable regression four-level hierarchical model (LVR-HM4) that uses a fully Bayesian approach. Using multisite multiple-cohort longitudinal data, for example, annual assessment scores over grades for students who are nested within cohorts within schools, the LVR-HM4 attempts to simultaneously model two types of…
Descriptors: Regression (Statistics), Hierarchical Linear Modeling, Longitudinal Studies, Cohort Analysis
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Allen, Jeff – Applied Measurement in Education, 2017
Using a sample of schools testing annually in grades 9-11 with a vertically linked series of assessments, a latent growth curve model is used to model test scores with student intercepts and slopes nested within school. Missed assessments can occur because of student mobility, student dropout, absenteeism, and other reasons. Missing data…
Descriptors: Achievement Gains, Academic Achievement, Growth Models, Scores
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Sebro, Negusse Yohannes; Goshu, Ayele Taye – Journal of Education and Learning, 2017
This study aims to explore Bayesian multilevel modeling to investigate variations of average academic achievement of grade eight school students. A sample of 636 students is randomly selected from 26 private and government schools by a two-stage stratified sampling design. Bayesian method is used to estimate the fixed and random effects. Input and…
Descriptors: Foreign Countries, Hierarchical Linear Modeling, Academic Achievement, Secondary School Students
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Yuan, Kun; McCaffrey, Daniel F.; Savitsky, Terrance D. – Society for Research on Educational Effectiveness, 2013
Standardized teaching observation protocols have become increasingly popular in evaluating teaching in recent years. One of such protocols that has gained substantial interest from researchers and practitioners is the Classroom Assessment Scoring System-Secondary (CLASSS). According to the developer, CLASS-S has three domains of teacher-student…
Descriptors: Factor Structure, Bayesian Statistics, Multivariate Analysis, Teacher Student Relationship
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Johnson, Matthew S.; Jenkins, Frank – ETS Research Report Series, 2005
Large-scale educational assessments such as the National Assessment of Educational Progress (NAEP) sample examinees to whom an exam will be administered. In most situations the sampling design is not a simple random sample and must be accounted for in the estimating model. After reviewing the current operational estimation procedure for NAEP, this…
Descriptors: Bayesian Statistics, Hierarchical Linear Modeling, National Competency Tests, Sampling