Measurement Error, Multidimensionality, and Scale Shrinkage: A Reply to Yen and Burket.

Camilli, Gregory

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Peer reviewed

ERIC Number: EJ590615

Record Type: Journal

Publication Date: 1999

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ISSN: ISSN-0022-0655

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Measurement Error, Multidimensionality, and Scale Shrinkage: A Reply to Yen and Burket.

Camilli, Gregory

Journal of Educational Measurement, v36 n1 p73-78 Spr 1999

Yen and Burket suggested that shrinkage in vertical equating cannot be understood apart from multidimensionality. Reviews research on reliability, multidimensionality, and scale shrinkage, and explores issues of practical importance to educators. (SLD)

Descriptors: Equated Scores, Error of Measurement, Item Response Theory, Reliability, Scaling

Publication Type: Book/Product Reviews; Journal Articles

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Audience: N/A

Language: English

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