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Download full textFeng, Mingyu, Ed.; Käser, Tanja, Ed.; Talukdar, Partha, Ed. – International Educational Data Mining Society, 2023
The Indian Institute of Science is proud to host the fully in-person sixteenth iteration of the International Conference on Educational Data Mining (EDM) during July 11-14, 2023. EDM is the annual flagship conference of the International Educational Data Mining Society. The theme of this year's conference is "Educational data mining for…
Descriptors: Information Retrieval, Data Analysis, Computer Assisted Testing, Cheating
Weiss, David J., Ed. – 1980
This report is the Proceedings of the third conference of its type. Included are 23 of the 25 papers presented at the conference, discussion of these papers by invited discussants, and symposium papers by a group of leaders in adaptive testing and latent trait test theory research and applications. The papers are organized into the following…
Descriptors: Academic Ability, Academic Achievement, Comparative Testing, Computer Assisted Testing
