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| Nevo, Baruch | 1 |
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Peer reviewedNevo, Baruch – Journal of Educational Measurement, 1985
A literature review and a proposed means of measuring face validity, a test's appearance of being valid, are presented. Empirical evidence from examinees' perceptions of a college entrance examination support the reliability of measuring face validity. (GDC)
Descriptors: College Entrance Examinations, Evaluation Methods, Evaluators, Foreign Countries
Peer reviewedBerk, Ronald A. – Journal of Educational Measurement, 1980
A dozen different approaches that yield 13 reliability indices for criterion-referenced tests were identified and grouped into three categories: threshold loss function, squared-error loss function, and domain score estimation. Indices were evaluated within each category. (Author/RL)
Descriptors: Classification, Criterion Referenced Tests, Cutting Scores, Evaluation Methods
