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Download full textRentz, R. Robert; Rentz, Charlotte C. – 1978
Issues of concern to test developers interested in applying the Rasch model are discussed. The current state of the art, recommendations for use of the model, further needs, and controversies are described for the three stages of test construction: (1) definition of the content of the test and item writing; (2) item analysis; and (3) test…
Descriptors: Ability, Achievement Tests, Difficulty Level, Goodness of Fit
Peer reviewedAnd Others; Hambleton, Ronald K. – Review of Educational Research, 1978
Topics concerning latent trait theory are addressed: (1) dimensionality of latent space, local independence, and item characteristic curves; (2) models--equations, parameter estimation, testing assumptions, and goodness of fit, (3) applications test developments, item bias, tailored testing and equating; and (4) advantages over classical…
Descriptors: Ability, Bayesian Statistics, Goodness of Fit, Item Analysis
