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Sinharay, Sandip – Educational and Psychological Measurement, 2022
Administrative problems such as computer malfunction and power outage occasionally lead to missing item scores and hence to incomplete data on mastery tests such as the AP and U.S. Medical Licensing examinations. Investigators are often interested in estimating the probabilities of passing of the examinees with incomplete data on mastery tests.…
Descriptors: Mastery Tests, Computer Assisted Testing, Probability, Test Wiseness
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Finkelman, Matthew David – Applied Psychological Measurement, 2010
In sequential mastery testing (SMT), assessment via computer is used to classify examinees into one of two mutually exclusive categories. Unlike paper-and-pencil tests, SMT has the capability to use variable-length stopping rules. One approach to shortening variable-length tests is stochastic curtailment, which halts examination if the probability…
Descriptors: Mastery Tests, Computer Assisted Testing, Adaptive Testing, Test Length
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Gonzalez, Jorge E.; Vannest, Kimberly J.; Reid, Robert – Journal of At-Risk Issues, 2008
This study evaluated the ability of the kindergarten and first grade Dynamic Indicators of Basic Early Literacy Skills (DIBELS), measures of early literacy development, to discriminate among low average, average, and above average students considered at risk emotional and behavioral disorders (EBD) on the Total Reading cluster of the Woodcock…
Descriptors: General Education, Reading Fluency, Alphabets, Orthographic Symbols
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Divgi, D. R. – Applied Psychological Measurement, 1980
The dependence of reliability indices for mastery tests on mean and cutoff scores was examined in the case of three decision-theoretic indices. Dependence of kappa on mean and cutoff scores was opposite to that of the proportion of correct decisions, which was linearly related to average threshold loss. (Author/BW)
Descriptors: Classification, Cutting Scores, Mastery Tests, Test Reliability
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Huynh, Huynh – Psychometrika, 1978
The use of Cohen's kappa index as a measure of the reliability of multiple classifications is developed. Special cases of the index as well as the effects of test length on the index are also explored. (JKS)
Descriptors: Career Development, Classification, Mastery Tests, Test Length
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Huynh, Huynh – Psychometrika, 1980
A nonrandomized minimax solution is presented for passing scores on mastery tests using the binomial error model. The computation does not require prior knowledge regarding an individual examinee or group test data for a population of examinees. A scheme which allows for correction for guessing is also described. (Author/JKS)
Descriptors: Academic Standards, Classification, Criterion Referenced Tests, Cutting Scores
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Cahan, Sorel; Cohen, Nora – Educational and Psychological Measurement, 1990
A solution is offered to problems associated with the inequality in the manipulability of probabilities of classification errors of masters versus nonmasters, based on competency test results. Eschewing the typical arbitrary establishment of observed-score standards below 100 percent, the solution incorporates a self-correction of wrong answers.…
Descriptors: Classification, Error of Measurement, Mastery Tests, Minimum Competency Testing
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Tan, E. S.; And Others – Educational and Psychological Measurement, 1995
An optimal unbiased classification rule is proposed based on a longitudinal model for the measurement of change in ability. In general, the rule predicts future level of knowledge by using information about level of knowledge at entrance, its rate of growth, and the amount of within-individual variation. (SLD)
Descriptors: Ability, Change, Classification, Individual Differences
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Sternberg, Robert J.; Baron, Joan B. – Educational Leadership, 1985
The state of Connecticut has introduced a fourth-grade mastery test that assesses thinking skills. The test was developed cooperatively by the state's Department of Education, a testing corporation, and several cognitive psychologists; several alternative models of thinking were synthesized to produce a theoretical foundation for the test. (MCG)
Descriptors: Classification, Cognitive Processes, Cognitive Psychology, Cognitive Tests