This article proposes an item exposure control method, which is the extension of the Sympson and Hetter procedure and can provide item exposure control at both the item and test levels. Item exposure rate and test overlap rate are two indices commonly used to track item exposure in computerized adaptive tests. By considering both indices, item…

Examines the effectiveness of an automated language proficiency test assembly system at an air force base English Language Center. The study focuses on the equivalence of mean score difficulty, total score variance, and intercorrelation covariance across test norms and finds a high level of test-form equivalence and internal consistency. (nine…