Publication Date
| In 2025 | 0 |
| Since 2024 | 0 |
| Since 2021 (last 5 years) | 0 |
| Since 2016 (last 10 years) | 2 |
| Since 2006 (last 20 years) | 2 |
Descriptor
Author
| Steedle, Jeffrey | 2 |
| Cho, YoungWoo | 1 |
| Johnson, Marc | 1 |
| Keng, Leslie | 1 |
| McBride, Malena | 1 |
| Pashley, Peter | 1 |
Publication Type
| Numerical/Quantitative Data | 2 |
| Reports - Research | 2 |
Education Level
| Early Childhood Education | 1 |
| Elementary Education | 1 |
| Grade 3 | 1 |
| Grade 5 | 1 |
| Grade 7 | 1 |
| Grade 9 | 1 |
| High Schools | 1 |
| Higher Education | 1 |
| Intermediate Grades | 1 |
| Junior High Schools | 1 |
| Middle Schools | 1 |
| More ▼ | |
Audience
Location
| Arkansas | 1 |
| Colorado | 1 |
| District of Columbia | 1 |
| Illinois | 1 |
| Maryland | 1 |
| Massachusetts | 1 |
| Mississippi | 1 |
| New Jersey | 1 |
| New Mexico | 1 |
| Ohio | 1 |
| Rhode Island | 1 |
| More ▼ | |
Laws, Policies, & Programs
Assessments and Surveys
| ACT Assessment | 1 |
What Works Clearinghouse Rating
Download full textSteedle, Jeffrey; Pashley, Peter; Cho, YoungWoo – ACT, Inc., 2020
Three mode comparability studies were conducted on the following Saturday national ACT test dates: October 26, 2019, December 14, 2019, and February 8, 2020. The primary goal of these studies was to evaluate whether ACT scores exhibited mode effects between paper and online testing that would necessitate statistical adjustments to the online…
Descriptors: Test Format, Computer Assisted Testing, College Entrance Examinations, Scores
Steedle, Jeffrey; McBride, Malena; Johnson, Marc; Keng, Leslie – Partnership for Assessment of Readiness for College and Careers, 2016
The first operational administration of the Partnership for Assessment of Readiness for College and Careers (PARCC) took place during the 2014-2015 school year. In addition to the traditional paper-and-pencil format, the assessments were available for administration on a variety of electronic devices, including desktop computers, laptop computers,…
Descriptors: Computer Assisted Testing, Difficulty Level, Test Items, Scores
