Publication Date
In 2025 | 0 |
Since 2024 | 0 |
Since 2021 (last 5 years) | 0 |
Since 2016 (last 10 years) | 2 |
Since 2006 (last 20 years) | 3 |
Descriptor
Source
Communique | 3 |
Author
Cormier, Damien C. | 1 |
Flanagan, Agnes | 1 |
Lichtenstein, Robert | 1 |
Mitchell, Alison M. | 1 |
Petscher, Yaacov | 1 |
Truckenmiller, Adrea | 1 |
Publication Type
Journal Articles | 3 |
Reports - Descriptive | 3 |
Education Level
Audience
Counselors | 1 |
Practitioners | 1 |
Location
Laws, Policies, & Programs
Assessments and Surveys
Stanford Binet Intelligence… | 1 |
Wechsler Intelligence Scale… | 1 |
What Works Clearinghouse Rating
Flanagan, Agnes; Cormier, Damien C. – Communique, 2019
One of the areas subsumed under the data-based decision making and accountability practice identified in the National Association of School Psychologists' (NASP) "Model for Integrated School Psychological Services" is to collect information on psychological and educational variables to make decisions at a number of levels of service…
Descriptors: Test Bias, School Psychologists, Measurement, Data Collection
Lichtenstein, Robert – Communique, 2020
Appropriate interpretation of assessment data requires an appreciation that tools are subject to measurement error. School psychologists recognize, at least on an intellectual level, that measures are imperfect--that test scores and other quantitative measures (e.g., rating scales, systematic behavioral observations) are best estimates of…
Descriptors: Error of Measurement, Test Reliability, Pretests Posttests, Standardized Tests
Mitchell, Alison M.; Truckenmiller, Adrea; Petscher, Yaacov – Communique, 2015
As part of the Race to the Top initiative, the United States Department of Education made nearly 1 billion dollars available in State Educational Technology grants with the goal of ramping up school technology. One result of this effort is that states, districts, and schools across the country are using computerized assessments to measure their…
Descriptors: Computer Assisted Testing, Educational Technology, Testing, Efficiency