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Cui, Zhongmin – Educational Measurement: Issues and Practice, 2021
Commonly used machine learning applications seem to relate to big data. This article provides a gentle review of machine learning and shows why machine learning can be applied to small data too. An example of applying machine learning to screen irregularity reports is presented. In the example, the support vector machine and multinomial naïve…
Descriptors: Artificial Intelligence, Man Machine Systems, Data, Bayesian Statistics
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Wu, Margaret – Educational Measurement: Issues and Practice, 2010
In large-scale assessments, such as state-wide testing programs, national sample-based assessments, and international comparative studies, there are many steps involved in the measurement and reporting of student achievement. There are always sources of inaccuracies in each of the steps. It is of interest to identify the source and magnitude of…
Descriptors: Testing Programs, Educational Assessment, Measures (Individuals), Program Effectiveness
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Kim, Jee-Seon; Bolt, Daniel M. – Educational Measurement: Issues and Practice, 2007
The purpose of this ITEMS module is to provide an introduction to Markov chain Monte Carlo (MCMC) estimation for item response models. A brief description of Bayesian inference is followed by an overview of the various facets of MCMC algorithms, including discussion of prior specification, sampling procedures, and methods for evaluating chain…
Descriptors: Placement, Monte Carlo Methods, Markov Processes, Measurement