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Fuchimoto, Kazuma; Ishii, Takatoshi; Ueno, Maomi – IEEE Transactions on Learning Technologies, 2022
Educational assessments often require uniform test forms, for which each test form has equivalent measurement accuracy but with a different set of items. For uniform test assembly, an important issue is the increase of the number of assembled uniform tests. Although many automatic uniform test assembly methods exist, the maximum clique algorithm…
Descriptors: Simulation, Efficiency, Test Items, Educational Assessment
Tran, Tich Phuoc; Meacheam, David – IEEE Transactions on Learning Technologies, 2020
The use of learning management systems (LMSs) for learning and knowledge sharing has accelerated quickly both in education and corporate worlds. Despite the benefits brought by LMSs, the current systems still face significant challenges, including the lack of automation in generating quiz questions and managing courses. Over the past decade, more…
Descriptors: Integrated Learning Systems, Test Construction, Test Items, Automation