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Peer reviewedLinacre, John M.; Wright, Benjamin D. – Journal of Applied Measurement, 2002
Describes an extension to the Rasch model for fundamental measurement in which there is parameterization not only for examinee ability and item difficulty but also for judge severity. Discusses variants of this model and judging plans, and explains its use in an empirical testing situation. (SLD)
Descriptors: Ability, Difficulty Level, Evaluators, Item Response Theory
