Descriptor
Item Analysis | 4 |
Microcomputers | 4 |
Difficulty Level | 3 |
Test Items | 3 |
Computer Assisted Testing | 2 |
Computer Software | 2 |
Higher Education | 2 |
Optical Scanners | 2 |
Test Reliability | 2 |
Adaptive Testing | 1 |
Diagnostic Tests | 1 |
More ▼ |
Source
Collegiate Microcomputer | 1 |
Publication Type
Reports - Descriptive | 4 |
Computer Programs | 2 |
Journal Articles | 1 |
Education Level
Audience
Practitioners | 1 |
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Anderson, David E. – 1982
A test scoring system was developed, composed of an optical mark sense card reader (Chatsworth Data Corporation) interfaced with a microcomputer (TRS-80 Model I) that provided the opportunity to do extensive diagnostic and course material testing with item analysis. This system reduced the amount of time required to determine the suitability of…
Descriptors: Diagnostic Tests, Higher Education, Item Analysis, Microcomputers

Cobern, William W. – 1986
This computer program, written in BASIC, performs three different calculations of test reliability: (1) the Kuder-Richardson method; (2); the "common split-half" method; and (3) the Rulon-Guttman split-half method. The program reads sequential access data files for microcomputers that have been set up by statistical packages such as…
Descriptors: Computer Software, Difficulty Level, Educational Research, Equations (Mathematics)
Thompson, Bruce; Levitov, Justin E. – Collegiate Microcomputer, 1985
Discusses features of a microcomputer program, SCOREIT, used at New Orleans' Loyola University and several high schools to score and analyze test results. Benefits and dimensions of the program's automated test and item analysis are outlined, and several examples illustrating test and item analyses by SCOREIT are presented. (MBR)
Descriptors: Computer Assisted Testing, Computer Software, Difficulty Level, Higher Education
Linacre, John M. – 1987
This paper describes a computer program in Microsoft BASIC which selects and administers test items from a small item bank. The level of the difficulty of the item selected depends on the test taker's previous response. This adaptive system is based on the Rasch model. The Rasch model uses a unit of measurement based on the logarithm of the…
Descriptors: Adaptive Testing, Computer Assisted Testing, Difficulty Level, Individual Testing