Takers of educational tests often receive proficiency levels instead of or in addition to scaled scores. For example, proficiency levels are reported for the Advanced Placement (AP®) and U.S. Medical Licensing examinations. Technical difficulties and other unforeseen events occasionally lead to missing item scores and hence to incomplete data on…

This article discusses estimation of average treatment effects for randomized controlled trials (RCTs) using grouped administrative data to help improve data access. The focus is on design-based estimators, derived using the building blocks of experiments, that are conducive to grouped data for a wide range of RCT designs, including clustered and…

We propose new methods for identifying and classifying aberrant response patterns (ARPs) by means of functional data analysis. These methods take the person response function (PRF) of an individual and compare it with the pattern that would correspond to a generic individual of the same ability according to the item-person response surface. ARPs…

Machine learning is a popular topic in data analysis and modeling. Many different machine learning algorithms have been developed and implemented in a variety of programming languages over the past 20 years. In this article, we first provide an overview of machine learning and clarify its difference from statistical inference. Then, we review…

Multiple imputation is a popular method for addressing data that are presumed to be missing at random. To obtain accurate results, one's imputation model must be congenial to (appropriate for) one's intended analysis model. This article reviews and demonstrates two recent software packages, Blimp and jomo, to multiply impute data in a manner…

In recent years, a wide array of tools have emerged for the purposes of conducting educational data mining (EDM) and/or learning analytics (LA) research. In this article, we hope to highlight some of the most widely used, most accessible, and most powerful tools available for the researcher interested in conducting EDM/LA research. We will…

The impact of uncertainty about item parameters on test information functions is investigated. The information function of a test is one of the most important tools in item response theory (IRT). Inaccuracy in the estimation of test information can have substantial consequences on data analyses based on IRT. In this article, the major part (called…

Reporting methods used in large-scale assessments such as the National Assessment of Educational Progress (NAEP) rely on latent regression models. To fit the latent regression model using the maximum likelihood estimation technique, multivariate integrals must be evaluated. In the computer program MGROUP used by the Educational Testing Service for…

Longitudinal panel data examples are used to illustrate estimation methods for individual growth curve models. These examples demonstrate issues and concerns in the application of hierarchical modeling estimation, specifically the hierarchical linear models of A. S. Bryk and S. W. Raudenbush. (SLD)

Argues that correspondence analysis is particularly well-suited to data about an individual's career, and this is illustrated by an example from educational careers. It is also shown that correspondence analysis can be used for a quantification of individual careers into one or more scores, or a classification, for further analyses. (SLD)

An "Educational Researcher" article by Pamela Moss (1994) asks the title question, "Can there be validity without reliability?" Yes, she answers, if by reliability one means "consistency among independent observations intended as interchangeable" (Moss, 1994, p. 7), quantified by internal consistency indices such as…

Describes and assesses missing data methods currently used to analyze data from matrix sampling designs implemented by the National Assessment of Educational Progress. Several improved methods are developed, and these models are evaluated using an EM algorithm to obtain maximum likelihood estimates followed by multiple imputation of complete data…