This article proposes an item exposure control method, which is the extension of the Sympson and Hetter procedure and can provide item exposure control at both the item and test levels. Item exposure rate and test overlap rate are two indices commonly used to track item exposure in computerized adaptive tests. By considering both indices, item…

A basic technical framework is provided for the design and use of mastery tests. The Mastery Testing Project (MTP) prepared this framework using advanced mathematics supplemented with computer simulation based on real test data collected by the South Carolina Statewide Testing Program. The MTP focused on basic technical issues encountered in using…