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Puhan, Gautam – Applied Measurement in Education, 2009
The purpose of this study is to determine the extent of scale drift on a test that employs cut scores. It was essential to examine scale drift for this testing program because new forms in this testing program are often put on scale through a series of intermediate equatings (known as equating chains). This process may cause equating error to…
Descriptors: Testing Programs, Testing, Measurement Techniques, Item Response Theory
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Wyse, Adam E.; Mapuranga, Raymond – International Journal of Testing, 2009
Differential item functioning (DIF) analysis is a statistical technique used for ensuring the equity and fairness of educational assessments. This study formulates a new DIF analysis method using the information similarity index (ISI). ISI compares item information functions when data fits the Rasch model. Through simulations and an international…
Descriptors: Test Bias, Evaluation Methods, Test Items, Educational Assessment
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Huynh, Huynh – Journal of Educational Statistics, 1990
False positive and false negative error rates were studied for competency testing when failing examinees are permitted to retake the test. Formulas are provided for the beta-binomial and Rasch models. Estimates based on these models are compared for six data sets from the South Carolina Basic Skills Assessment Program. (SLD)
Descriptors: Elementary Secondary Education, Equations (Mathematics), Error Patterns, Estimation (Mathematics)